Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.
SEM Specimen Stubs, 32mm dia, re-entrant base AGG305SEM Specimen Stubs for CAMBRIDGE ANALYSIS instruments. 32mm dia, re-entrant base. Aluminium.Average lead time: 43 days£108.22Average lead time: 43 days
SEM Specimen Stubs, 25mm dia, threaded pin AGG3025SEM Specimen Stubs for HITACHI instruments. 25mm dia, threaded pin. Aluminium.In Stock£252.35In Stock- SEM Specimen Stubs, 32mm dia, re-entrant base, carbon AGG327SEM Specimen Stubs for CAMBRIDGE ANALYSIS instruments. 32mm dia, re-entrant base. Carbon. Special prices valid while stocks last.In StockSpecial Price £5.80 was £13.36 You save: £9.07 (57%)In Stock
- SEM Specimen Stubs for Environmental MicroscopyEnvironmental Microscopy specimen stubs. Special prices valid while stocks last.Average lead time: 1 to 28 days
From £87.95
Average lead time: 1 to 28 days - SEM Specimen Stubs, Deben CoolstageDeben Coolstage SEM Specimen Stubs Special prices valid while stocks last.Average lead time: 1 to 19 days
From £216.67
Average lead time: 1 to 19 days 
SEM Specimen Stubs, 25.4mm square. Gun residue holders AGG3595SEM Specimen Stubs for forensic science. 25.4mm square (1"). Aluminium.Average lead time: 58 days£85.51Average lead time: 58 days
