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Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.

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65 products available

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  1. SEM Specimen Stubs
    SEM Specimen Stubs, 12.5mm dia, 3.2 x 8mm pin
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. AGG301, AGG301B and AGG301C.
    Average lead time: 1 to 26 days

    From £10.69

    Average lead time: 1 to 26 days
  2. AGG301F Short Pin SEM Specimen Stub
    SEM Specimen Stubs - Short Pin
    SEM Specimen Stubs for LEO/ZEISS instruments. 12.5mm dia, pin length 6mm.
    Average lead time: 1 to 12 days

    From £27.12

    Average lead time: 1 to 12 days
  4. SEM Specimen Stubs
    SEM Specimen Stubs, 12.5mm dia, 3.2 x 8mm pin, no groove AGG301A
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, pin length 8mm. No groove. Aluminium.
    In Stock
    £29.35
    In Stock
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  6. SALE SEM Specimen Stubs
    SEM Specimen Stubs, 12.5mm dia, 3.2 x 15mm pin AGG3325
    SEM Specimen Stubs for AMRAY instruments. 12.5mm dia, pin length 15mm. Aluminium. Special prices valid while stocks last. 
    Average lead time: 43 days
    Special Price £49.46 was £67.51 You save: £21.66 (27%)
    Average lead time: 43 days
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  8. SEM Specimen Stubs
    SEM Specimen Stubs, 12.7mm dia, low profile 45° chamfer, 9.5mm pin AGG3161
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, low profile 45° chamfer, pin length 9.5mm. Aluminium.
    In Stock
    £6.71
    In Stock
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  9. SEM Specimen Stubs, 12.7mm dia, low profile 45° chamfer, 6mm pin
    SEM Specimen Stubs, 12.7mm dia, low profile 45° chamfer, 6mm pin AGG3161-6
    12.7mm dia, low profile 45° chamfer, pin length 6mm. Aluminium.
    Average lead time: 43 days
    £3.99
    Average lead time: 43 days
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  12. SEM Specimen Stubs
    SEM Specimen Stubs, 12.7mm dia, 45/90° chamfer, 9.5mm pin AGG3162
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, 45/90° chamfer, pin length 9.5mm. Aluminium.
    In Stock
    £5.00
    In Stock
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  13. SEM Specimen Stubs
    SEM Specimen Stubs, 12.7mm dia, 45/90° chamfer, 7.8mm pin AGG3160
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, 45/90° chamfer, pin length 7.8mm. Aluminium.
    In Stock
    £4.99
    In Stock
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  15. SALE SEM Specimen Stubs
    SEM Specimen Stubs, 32mm dia, 8mm pin
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 32mm dia, pin length 8mm.
    Average lead time: 1 to 28 days

    From £92.96

    Average lead time: 1 to 28 days
  17. SEM Specimen Stubs
    SEM Specimen Stubs, 12.5mm dia, 45° chamfer AGG301E
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 45° chamfer. Aluminium.
    In Stock
    £25.30
    In Stock
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  19. SEM Specimen Stubs
    SEM Specimen Stubs, 12.5mm dia, 45° chamfer AGG3020
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 45° chamfer. Aluminium.
    In Stock
    £27.96
    In Stock
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  20. SEM Specimen Stubs
    SEM Specimen Stubs, 12.5mm dia, 20° chamfer AGG3020A
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 20° chamfer. Aluminium.
    In Stock
    £153.83
    In Stock
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  23. SEM Specimen Stubs 25mm dia
    SEM Specimen Stubs, 25mm dia, 3.2 x 6mm pin AGG399F
    SEM Specimen Stubs for LEO/ZEISS instruments. 25mm dia, pin length 6mm. Aluminium. Pack of 50. 
    In Stock
    £74.05
    In Stock
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  24. SEM Specimen Stubs
    SEM Specimen Stubs, 25mm dia, 3.2 x 8mm pin
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 25mm dia, pin length 3.2 x 8mm.
    Average lead time: 1 day

    From £29.02

    Average lead time: 1 day
  26. SEM Specimen Stubs
    SEM Specimen Stubs, 10mm dia, stub angled 45° AGG3309
    SEM Specimen Stubs for JEOL instruments. 10mm dia, stub angled 45° chamfer. Aluminium.
    In Stock
    £12.67
    In Stock
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  28. SEM Specimen Stubs
    SEM Specimen Stubs, 10mm dia, 5mm high, for JEOL heating stage AGG306A
    SEM Specimen Stubs for JEOL instruments. 10mm diameter.
    In Stock
    £14.51
    In Stock
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  30. SEM Specimen Stubs for JEOL instruments. 10mm dia, 10mm high.
    SEM Specimen Stubs, 10mm dia, 10mm high
    SEM Specimen Stubs for JEOL instruments. 10mm dia, 10mm high.
    Average lead time: 1 day

    From £17.25

    Average lead time: 1 day
  31. SEM Specimen Stubs
    SEM Specimen Stubs, 32mm dia, 10mm high AGG318
    SEM Specimen Stubs for CAMBRIDGE S600 instruments. 32mm dia, 10mm high. Aluminium.
    Average lead time: 43 days
    £98.93
    Average lead time: 43 days
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  34. SEM Specimen Stubs, re-entrant base
    SEM Specimen Stubs, 32mm dia, re-entrant base AGG305
    SEM Specimen Stubs for CAMBRIDGE ANALYSIS instruments. 32mm dia, re-entrant base. Aluminium.
    Average lead time: 43 days
    £108.22
    Average lead time: 43 days
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  35. SEM Specimen Stubs, 25mm dia, double 90° chamfer, 9.5 mm pin
    SEM Specimen Stubs, 25mm dia, double 90° chamfer, 9.5mm pin AGG3165
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments.
    In Stock
    £11.82
    In Stock
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  37. SALE Low profile pin stubs for FIB applications
    SEM Specimen Stubs, 12.7mm dia, low profile
    These low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications. Special prices valid while stocks last. 
    Average lead time: 1 day

    From £20.33

    Average lead time: 1 day
  39. SEM Specimen Stubs
    SEM Specimen Stubs, 25mm dia, 45/90° chamfer, 9.5mm pin AGG3164
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments.
    In Stock
    £13.43
    In Stock
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  41. SALE SEM Specimen Stubs
    SEM Specimen Stubs, 15mm dia, 10mm high, angled 70° chamfer for... AGG3168
    SEM Specimen Stubs for JEOL instruments. 15mm dia, pin length 10mm, angled 70° chamfer for EBSD.
    Average lead time: 43 days
    £57.30
    Average lead time: 43 days
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  42. SALE SEM Specimen Stubs
    SEM Specimen Stubs, 15mm dia, 10mm high, 45° chamfer AGG3167
    SEM Specimen Stubs for JEOL instruments. 15mm dia, 10mm high, 45° chamfer. Aluminium.
    Average lead time: 19 days
    £35.65
    Average lead time: 19 days
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PRICE & AVAILABILITY: Please note that while we are working closely with our suppliers to minimise any global supply chain issues, prices and availability may be subject to change at short notice.
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