Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.
- SEM Specimen Stubs, 15mm dia, 6mm high, M4 thread, carbon AGG3423SEM Specimen Stubs for HITACHI instruments. 15mm dia, 6mm high, M4 thread. Carbon. Special prices valid while stocks last.In StockSpecial Price £3.54 was £6.73 You save: £3.83 (47%)In Stock
SEM Specimen Stubs, 10mm dia, angled, carbon AGG3424SEM Specimen Stubs for JEOL instruments. 10mm dia, angled. Carbon.Average lead time: 43 days£12.48Average lead time: 43 days
SEM Specimen Stubs, 15mm dia, angled, carbon AGG3425SEM Specimen Stubs for ISI/ABT/TOPCON instruments. 15mm dia, angled. Carbon.Average lead time: 43 days£14.14Average lead time: 43 days- SEM Specimen Stubs, 12.5mm dia, 10mm high, carbon AGG3427SEM Specimen Stubs for JEOL instruments. 12.5mm dia, 10mm high. Carbon. Special prices valid while stocks last.In StockSpecial Price £2.83 was £4.41 You save: £1.90 (36%)In Stock
SEM Specimen Stubs, 12.7mm dia, 38° chamfer, low profileThese low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications.Average lead time: 1 dayFrom £44.96
Average lead time: 1 day
SEM Specimen Stubs, 12.7mm dia, 90° chamfer, with 6mm pin, low...These low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications.Average lead time: 43 daysFrom £30.80
Average lead time: 43 days
SEM Specimen Stubs, 12.7mm dia, 90° chamfer, low profileThese low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications.Average lead time: 1 dayFrom £34.21
Average lead time: 1 day
SEM Specimen Stubs, 12.7mm dia, 6mm pin, low profileThese low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications.Average lead time: 1 dayFrom £24.27
Average lead time: 1 day
SEM Specimen Stubs, 12.7mm dia, 36° chamfer, with 6mm pin, low...These low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications.Average lead time: 43 daysFrom £39.99
Average lead time: 43 days- TEM Grid Holder on SEM Pin StubA pin-type aluminium stub allowing four TEM grids to be securely held for SEM work. Special prices valid while stocks last.Average lead time: 1 to 58 days
From £74.56
Average lead time: 1 to 58 days - SEM Specimen Stubs for Environmental MicroscopyEnvironmental Microscopy specimen stubs. Special prices valid while stocks last.Average lead time: 1 to 28 days
From £87.95
Average lead time: 1 to 28 days - SEM Specimen Stubs, Deben CoolstageDeben Coolstage SEM Specimen Stubs Special prices valid while stocks last.Average lead time: 1 to 19 days
From £216.67
Average lead time: 1 to 19 days 
SEM Specimen Stubs, 25.4mm square. Gun residue holders AGG3595SEM Specimen Stubs for forensic science. 25.4mm square (1"). Aluminium.Average lead time: 58 days£85.51Average lead time: 58 days
SEM Cylinder Specimen MountsLarge Specimen and Metallurgical Mounts for JEOL microscopes.Average lead time: 19 to 28 daysFrom £3.38
Average lead time: 19 to 28 days
Hitachi SEM Cylinder Specimen MountsCylinder specimen mount for Hitachi TM3030/TM3000/TM1000 Tabletop SEM's. 15mm, 25mm and 35mm diameter.Average lead time: 1 to 28 daysFrom £18.85
Average lead time: 1 to 28 days
PELCO Q SEM Pin StubsPELCO Scanning Electron Microscopy Pin Stubs. A new fundamentally improved pin stub for correlative, corroborative and repetitive microscopy.Average lead time: 19 to 28 daysFrom £7.51
Average lead time: 19 to 28 days
SEM Stub Holder BlockUseful SEM holder block to firmly hold SEM stubs while preparing specimens for examination under SEM.Average lead time: 12 daysFrom £64.75
Average lead time: 12 days
