Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.
SEM Specimen Stubs, 25mm dia, 16mm high, double angled 90° chamfer AGG3172SEM Specimen Stubs for JEOL instruments. 25mm dia, 16mm high, double angled 90° chamfer. Aluminium.In Stock£11.16In Stock
SEM Specimen Stubs, 25mm dia, 16mm high, angled 45/90° chamfer AGG3171SEM Specimen Stubs for JEOL instruments. 25mm dia, 16mm high, angled 45/90° chamfer. Aluminium.In Stock£11.95In Stock- SEM Specimen Stubs, 25mm dia, 20mm high, angled 45° chamfer AGG3170SEM Specimen Stubs for JEOL instruments. 25mm dia, 20mm high, angled 45° chamfer. Aluminium.In Stock£7.96In Stock
SEM Specimen Stubs, 50mm dia, 5mm highSEM Specimen Stubs for JEOL instruments. 50mm dia, pin length 5mm. Aluminium.Average lead time: 43 daysFrom £160.78
Average lead time: 43 days
SEM Specimen Stubs, 25mm dia, 10mm high, cylinder stubSEM Specimen Stubs for JEOL instruments. 25mm dia, pin length 10mm, cylinder stubs. Aluminium.Average lead time: 1 dayFrom £112.05
Average lead time: 1 day
SEM Specimen Stubs, 12.7mm dia, low profile 70° chamfer, 9.5mm pin.... AGG3163SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, low profile 70° chamfer, pin length 8mm. EBSD. Aluminium.Average lead time: 43 days£7.80Average lead time: 43 days
SEM Specimen Stubs, 12.5mm dia, carbon AGG321SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia. CarbonIn Stock£5.54In Stock
SEM Specimen Stubs, 9.5mm dia, 9.5mm high, carbonSEM Specimen Stubs for JEOL instruments. 9.5mm dia, 9.5mm high. Carbon.Average lead time: 1 to 19 daysFrom £1.12
Average lead time: 1 to 19 days- SEM Specimen Stubs, 32mm dia, re-entrant base, carbon AGG327SEM Specimen Stubs for CAMBRIDGE ANALYSIS instruments. 32mm dia, re-entrant base. Carbon. Special prices valid while stocks last.In StockSpecial Price £5.80 was £13.36 You save: £9.07 (57%)In Stock
- SEM Specimen Stubs, 15mm dia, 6mm high, M4 thread, carbon AGG3423SEM Specimen Stubs for HITACHI instruments. 15mm dia, 6mm high, M4 thread. Carbon. Special prices valid while stocks last.In StockSpecial Price £3.54 was £6.73 You save: £3.83 (47%)In Stock
SEM Specimen Stubs, 10mm dia, angled, carbon AGG3424SEM Specimen Stubs for JEOL instruments. 10mm dia, angled. Carbon.Average lead time: 43 days£12.48Average lead time: 43 days
SEM Specimen Stubs, 15mm dia, angled, carbon AGG3425SEM Specimen Stubs for ISI/ABT/TOPCON instruments. 15mm dia, angled. Carbon.Average lead time: 43 days£14.14Average lead time: 43 days- SEM Specimen Stubs, 12.5mm dia, 10mm high, carbon AGG3427SEM Specimen Stubs for JEOL instruments. 12.5mm dia, 10mm high. Carbon. Special prices valid while stocks last.In StockSpecial Price £2.83 was £4.41 You save: £1.90 (36%)In Stock
- Carbon DiscsA range of 3mm thick carbon discs for mounting specimens.Average lead time: 1 to 19 days
From £48.10
Average lead time: 1 to 19 days 
Vitreous Carbon PlanchettesHigh purity, 2mm or 3mm thick planchettes with smooth polished surfaces, impermeable to gases and liquids. Suitable for analytical work and X-ray investigations. Also available unpolished.Average lead time: 1 to 43 daysFrom £96.86
Average lead time: 1 to 43 days
Carbon disc on 12.5mm stub. Box of 10 AGG3420
A 3mm thick carbon disc mounted on a conventional 12.5mm stub that provides an economical solution for microanalysis or low emission surface imaging applications requiring light element stubs.In Stock£67.47In Stock
SEM Specimen Stubs, 12.7mm dia, 38° chamfer, low profileThese low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications.Average lead time: 1 dayFrom £44.96
Average lead time: 1 day
SEM Specimen Stubs, 12.7mm dia, 90° chamfer, with 6mm pin, low...These low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications.Average lead time: 43 daysFrom £30.80
Average lead time: 43 days
SEM Specimen Stubs, 12.7mm dia, 90° chamfer, low profileThese low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications.Average lead time: 1 dayFrom £34.21
Average lead time: 1 day
SEM Specimen Stubs, 12.7mm dia, 6mm pin, low profileThese low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications.Average lead time: 1 dayFrom £24.27
Average lead time: 1 day- Pin type adaptor for Cambridge analytical stub AGG3657Adaptor allowing 32mm Cambridge stubs with re-entrant bases to be used in a stage designed for pin type stubs.Call for leadtime£121.58Call for leadtime
SEMClip Specimen Mounts, Cylinder mounts with M4 Thread, 15mmCylinder mount SEMClips for Hitachi SEMs, with M4 thread. 15mm diameter.Average lead time: 26 daysFrom £33.28
Average lead time: 26 days
SEMClip Specimen Mounts, Pin Stub mounts, 18mmPin stub versions of SEMClip mounts are available in 18 to 50mm diameters, and can be used with all SEMs using pin stubs.Average lead time: 8 daysFrom £34.40
Average lead time: 8 days
SEMClip Specimen Mounts, Cylinder mounts with M4 Thread, 25mm, AngledCylinder mount SEMClips for Hitachi SEMs, with M4 thread. Angled available in 25mm.Average lead time: 1 to 12 daysFrom £59.94
Average lead time: 1 to 12 days
