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Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.

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  1. SALE SEM Specimen Stubs
    SEM Specimen Stub, 10mm dia, 10mm high, 45° chamfer AGG3166
    SEM Specimen Stub for JEOL instruments. 10mm dia, 10mm high, 45° chamfer. Aluminium.
    In Stock
    £8.06
    In Stock
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  2. SEM Specimen Stubs, 25mm dia, 5mm high, cylinder stub
    SEM Specimen Stubs, 25mm dia, 5mm high, cylinder stub
    SEM Specimen Stubs for JEOL instruments. 25mm dia, 5mm high, cylinder stubs. Aluminium.
    Average lead time: 1 day

    From £85.79

    Average lead time: 1 day
  4. SEM Specimen Stubs, 15mm dia, 5mm high
    SEM Specimen Stubs, 15mm dia, 5mm high
    SEM Specimen Stubs for JEOL instruments. 15mm dia, pin length 5mm. Aluminium.
    Average lead time: 53 days

    From £35.86

    Average lead time: 53 days
  6. SEM Specimen Stubs
    SEM Specimen Stubs, 32mm dia, 5mm high AGG3376
    SEM Specimen Stubs for JEOL instruments. 32mm dia, 5mm high. Aluminium.
    In Stock
    £91.63
    In Stock
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  8. SEM Specimen Stubs 50mm dia
    SEM Specimen Stubs, 50mm dia, 10mm high (Pk 20) AGG3387-20
    SEM Specimen Stubs for JEOL instruments. 50mm dia, 10mm high. Aluminium.
    In Stock
    £78.83
    In Stock
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  9. SALE SEM Specimen Stubs
    SEM Specimen Stubs, 32mm dia, 20mm high
    SEM Specimen Stubs for JEOL instruments. 32mm dia, 20mm high. Aluminium. Special prices valid while stocks last. 
    Average lead time: 19 to 58 days

    From £35.96

    Average lead time: 19 to 58 days
  12. SEM Specimen Stubs
    SEM Specimen Stubs, 12.5mm dia, 5mm high AGG3385
    SEM Specimen Stubs for JEOL instruments. 12.5mm diameter.
    In Stock
    £14.66
    In Stock
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  13. SEM Specimen Stubs
    SEM Specimen Stubs, 12.5mm dia, 10mm high AGG3384
    SEM Specimen Stubs for JEOL instruments. 12.5mm dia, 10mm high. Aluminium.
    Average lead time: 43 days
    £15.63
    Average lead time: 43 days
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  15. SEM Specimen Stubs
    SEM Specimen Stubs, 15mm dia, 12mm high, M4 thread, angled 70°... AGG3313B
    SEM Specimen Stubs for HITACHI instruments. 15mm dia, 12mm high, M4 thread, angled 70° chamfer for EBSD. Aluminium.
    In Stock
    £8.94
    In Stock
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  17. SEM Specimen Stubs, 15mm dia, 10mm high, M4 thread, angled 45/90° chamfer
    SEM Specimen Stubs, 15mm dia, 10mm high, M4 thread, angled 45/90°... AGG3313D
    SEM Specimen Stubs for HITACHI instruments. 15mm dia, 10mm high, M4 thread, angled 45/90° chamfer. Aluminium.
    Average lead time: 43 days
    £11.87
    Average lead time: 43 days
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  19. SEM Specimen Stubs 15mm dia M4 thread
    SEM Specimen Stubs, 15mm dia, 10mm high, M4 thread, angled 45°... AGG3313A
    SEM Specimen Stubs for HITACHI instruments. 15mm diameter.
    Average lead time: 12 days
    £8.87
    Average lead time: 12 days
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  20. SEM Specimen Stubs
    SEM Specimen Stubs, 25mm dia, threaded pin AGG3025
    SEM Specimen Stubs for HITACHI instruments. 25mm dia, threaded pin. Aluminium.
    In Stock
    £252.35
    In Stock
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  23. SEM Specimen Stubs, 32mm dia, 10mm high, M4 thread
    SEM Specimen Stubs, 32mm dia, 10mm high, M4 thread AGG3318
    SEM Specimen Stubs for HITACHI instruments. 32mm dia, 10mm high, M4 thread. Aluminium.
    Average lead time: 43 days
    £117.37
    Average lead time: 43 days
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  24. SEM Specimen Stubs, 25mm dia, 6mm high, M4 thread
    SEM Specimen Stubs, 25mm dia, 6mm high, M4 thread AGG3377
    SEM Specimen Stubs for HITACHI instruments. 25mm dia, 6mm high, M4 thread. Aluminium.
    In Stock
    £62.19
    In Stock
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  26. SEM Specimen Stubs, 15mm dia, 6mm high, M4 thread
    SEM Specimen Stubs, 15mm dia, 6mm high, M4 thread AGG3313
    SEM Specimen Stubs for HITACHI instruments. 15mm dia, 6mm high, M4 thread. Aluminium. Pack of 50.
    In Stock
    £70.51
    In Stock
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  28. SEM Specimen Stubs
    SEM Specimen Stubs, 25mm dia, 16mm high, double angled 90° chamfer AGG3172
    SEM Specimen Stubs for JEOL instruments. 25mm dia, 16mm high, double angled 90° chamfer. Aluminium.
    In Stock
    £11.16
    In Stock
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  30. SEM Specimen Stubs, 25mm dia, 16mm high, angled 45/90° chamfer
    SEM Specimen Stubs, 25mm dia, 16mm high, angled 45/90° chamfer AGG3171
    SEM Specimen Stubs for JEOL instruments. 25mm dia, 16mm high, angled 45/90° chamfer. Aluminium.
    In Stock
    £11.95
    In Stock
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  31. SALE SEM Specimen Stubs
    SEM Specimen Stubs, 25mm dia, 20mm high, angled 45° chamfer AGG3170
    SEM Specimen Stubs for JEOL instruments. 25mm dia, 20mm high, angled 45° chamfer. Aluminium.
    In Stock
    £7.96
    In Stock
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  34. SEM Specimen Stubs, 50mm dia, 5mm high
    SEM Specimen Stubs, 50mm dia, 5mm high
    SEM Specimen Stubs for JEOL instruments. 50mm dia, pin length 5mm. Aluminium.
    Average lead time: 43 days

    From £160.78

    Average lead time: 43 days
  35. SEM Specimen Stubs, 25mm dia, 10mm high, cylinder stub
    SEM Specimen Stubs, 25mm dia, 10mm high, cylinder stub
    SEM Specimen Stubs for JEOL instruments. 25mm dia, pin length 10mm, cylinder stubs. Aluminium.
    Average lead time: 1 day

    From £112.05

    Average lead time: 1 day
  37. SEM Specimen Stubs
    SEM Specimen Stubs, 12.7mm dia, low profile 70° chamfer, 9.5mm pin.... AGG3163
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, low profile 70° chamfer, pin length 8mm. EBSD. Aluminium.
    Average lead time: 43 days
    £7.80
    Average lead time: 43 days
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  39. Carbon stubs
    SEM Specimen Stubs, 12.5mm dia, carbon AGG321
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia. Carbon
    In Stock
    £5.54
    In Stock
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  41. SEM Specimen Stubs, 9.5mm dia, 9.5mm high, carbon
    SEM Specimen Stubs, 9.5mm dia, 9.5mm high, carbon
    SEM Specimen Stubs for JEOL instruments. 9.5mm dia, 9.5mm high. Carbon.
    Average lead time: 1 to 19 days

    From £1.12

    Average lead time: 1 to 19 days
  42. SALE Carbon stubs
    SEM Specimen Stubs, 32mm dia, re-entrant base, carbon AGG327
    SEM Specimen Stubs for CAMBRIDGE ANALYSIS instruments. 32mm dia, re-entrant base. Carbon. Special prices valid while stocks last. 
    In Stock
    Special Price £5.80 was £13.36 You save: £9.07 (57%)
    In Stock
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PRICE & AVAILABILITY: Please note that while we are working closely with our suppliers to minimise any global supply chain issues, prices and availability may be subject to change at short notice.
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