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Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.

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130 products available

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  1. SEM Specimen Stubs, re-entrant base
    SEM Specimen Stubs, 32mm dia, re-entrant base AGG305
    SEM Specimen Stubs for CAMBRIDGE ANALYSIS instruments. 32mm dia, re-entrant base. Aluminium.
    Average lead time: 44 days
    £108.22
    Average lead time: 44 days
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  2. Aluminium pin stubs - high purity
    SEM pin stubs, high purity Aluminium, pack of 100 AGG301P
    High purity 12.5mm dia aluminium SEM pin stubs.
    In Stock
    £76.42
    In Stock
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  4. SEM Specimen Stubs, 25mm dia, double 90° chamfer, 9.5 mm pin
    SEM Specimen Stubs, 25mm dia, double 90° chamfer, 9.5mm pin AGG3165
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments.
    In Stock
    £11.82
    In Stock
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  6. SALE Low profile pin stubs for FIB applications
    SEM Specimen Stubs, 12.7mm dia, low profile
    These low profile aluminium pin stubs are available as flat or 90°, as well as with specific angles to accommodate specimens with small working distances in FIB applications. Special prices valid while stocks last. 
    Average lead time: 1 day

    From £20.33

    Average lead time: 1 day
  8. SEM Specimen Stubs
    SEM Specimen Stubs, 25mm dia, 45/90° chamfer, 9.5mm pin AGG3164
    SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments.
    In Stock
    £13.43
    In Stock
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  9. AGG319
    Pin Stub - 100mm dia x 9.5mm Pin Height AGG319
    Aluminium pin stub available for AMRAY, Cambridge, Leica, ZEISS/LEO, FEI/Philips, CamScan & TESCAN.
    In Stock
    £140.05
    In Stock
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  12. Rotating SEM Specimen Holder
    Rotating SEM Specimen Holder
    A unique rotating SEM Specimen holder allows a sample to be pinned and rotated through 360° which, combined with an electron absorption chamber, yields clear images from any angle on a completely black background.
    Average lead time: 27 days

    From £204.90

    Average lead time: 27 days
  13. SALE SEM Specimen Stubs
    SEM Specimen Stubs, 15mm dia, 10mm high, angled 70° chamfer for... AGG3168
    SEM Specimen Stubs for JEOL instruments. 15mm dia, pin length 10mm, angled 70° chamfer for EBSD.
    Average lead time: 44 days
    £57.30
    Average lead time: 44 days
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  15. SALE SEM Specimen Stubs
    SEM Specimen Stubs, 15mm dia, 10mm high, 45° chamfer AGG3167
    SEM Specimen Stubs for JEOL instruments. 15mm dia, 10mm high, 45° chamfer. Aluminium.
    Average lead time: 20 days
    £35.65
    Average lead time: 20 days
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  17. SALE SEM Specimen Stubs
    SEM Specimen Stub, 10mm dia, 10mm high, 45° chamfer AGG3166
    SEM Specimen Stub for JEOL instruments. 10mm dia, 10mm high, 45° chamfer. Aluminium.
    In Stock
    £8.06
    In Stock
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  19. SEM Specimen Stubs, 25mm dia, 5mm high, cylinder stub
    SEM Specimen Stubs, 25mm dia, 5mm high, cylinder stub
    SEM Specimen Stubs for JEOL instruments. 25mm dia, 5mm high, cylinder stubs. Aluminium.
    Average lead time: 1 day

    From £85.79

    Average lead time: 1 day
  20. SEM Specimen Stubs, 15mm dia, 5mm high
    SEM Specimen Stubs, 15mm dia, 5mm high
    SEM Specimen Stubs for JEOL instruments. 15mm dia, pin length 5mm. Aluminium.
    Average lead time: 54 days

    From £35.86

    Average lead time: 54 days
  23. SEM Specimen Stubs
    SEM Specimen Stubs, 32mm dia, 5mm high AGG3376
    SEM Specimen Stubs for JEOL instruments. 32mm dia, 5mm high. Aluminium.
    In Stock
    £91.63
    In Stock
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  24. SEM Specimen Stubs 50mm dia
    SEM Specimen Stubs, 50mm dia, 10mm high (Pk 20) AGG3387-20
    SEM Specimen Stubs for JEOL instruments. 50mm dia, 10mm high. Aluminium.
    In Stock
    £78.83
    In Stock
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  26. SALE SEM Specimen Stubs
    SEM Specimen Stubs, 32mm dia, 20mm high
    SEM Specimen Stubs for JEOL instruments. 32mm dia, 20mm high. Aluminium. Special prices valid while stocks last. 
    Average lead time: 20 to 59 days

    From £35.96

    Average lead time: 20 to 59 days
  28. SEM Specimen Stubs
    SEM Specimen Stubs, 12.5mm dia, 5mm high AGG3385
    SEM Specimen Stubs for JEOL instruments. 12.5mm diameter.
    In Stock
    £14.66
    In Stock
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  30. SEM Specimen Stubs
    SEM Specimen Stubs, 12.5mm dia, 10mm high AGG3384
    SEM Specimen Stubs for JEOL instruments. 12.5mm dia, 10mm high. Aluminium.
    Average lead time: 44 days
    £15.63
    Average lead time: 44 days
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  31. SEM Specimen Stubs
    SEM Specimen Stubs, 15mm dia, 12mm high, M4 thread, angled 70°... AGG3313B
    SEM Specimen Stubs for HITACHI instruments. 15mm dia, 12mm high, M4 thread, angled 70° chamfer for EBSD. Aluminium.
    In Stock
    £8.94
    In Stock
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  34. SEM Specimen Stubs, 15mm dia, 10mm high, M4 thread, angled 45/90° chamfer
    SEM Specimen Stubs, 15mm dia, 10mm high, M4 thread, angled 45/90°... AGG3313D
    SEM Specimen Stubs for HITACHI instruments. 15mm dia, 10mm high, M4 thread, angled 45/90° chamfer. Aluminium.
    Average lead time: 44 days
    £11.87
    Average lead time: 44 days
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  35. SEM Specimen Stubs 15mm dia M4 thread
    SEM Specimen Stubs, 15mm dia, 10mm high, M4 thread, angled 45°... AGG3313A
    SEM Specimen Stubs for HITACHI instruments. 15mm diameter.
    Average lead time: 13 days
    £8.87
    Average lead time: 13 days
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  37. SEM Specimen Stubs
    SEM Specimen Stubs, 25mm dia, threaded pin AGG3025
    SEM Specimen Stubs for HITACHI instruments. 25mm dia, threaded pin. Aluminium.
    In Stock
    £252.35
    In Stock
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  39. SEM Specimen Stubs, 32mm dia, 10mm high, M4 thread
    SEM Specimen Stubs, 32mm dia, 10mm high, M4 thread AGG3318
    SEM Specimen Stubs for HITACHI instruments. 32mm dia, 10mm high, M4 thread. Aluminium.
    Average lead time: 44 days
    £117.37
    Average lead time: 44 days
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  41. SEM Specimen Stubs, 25mm dia, 6mm high, M4 thread
    SEM Specimen Stubs, 25mm dia, 6mm high, M4 thread AGG3377
    SEM Specimen Stubs for HITACHI instruments. 25mm dia, 6mm high, M4 thread. Aluminium.
    In Stock
    £62.19
    In Stock
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  42. SEM Specimen Stubs, 15mm dia, 6mm high, M4 thread
    SEM Specimen Stubs, 15mm dia, 6mm high, M4 thread AGG3313
    SEM Specimen Stubs for HITACHI instruments. 15mm dia, 6mm high, M4 thread. Aluminium. Pack of 50.
    In Stock
    £70.51
    In Stock
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PRICE & AVAILABILITY: Please note that while we are working closely with our suppliers to minimise any global supply chain issues, prices and availability may be subject to change at short notice.
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