Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.
- SEM Specimen Stubs, 12.5mm dia, 3.2 x 15mm pin AGG3325SEM Specimen Stubs for AMRAY instruments. 12.5mm dia, pin length 15mm. Aluminium. Special prices valid while stocks last.Average lead time: 44 daysSpecial Price £49.46 was £67.51 You save: £21.66 (27%)Average lead time: 44 days
SEM Specimen Stubs, 15mm dia, angled, carbon AGG3425SEM Specimen Stubs for ISI/ABT/TOPCON instruments. 15mm dia, angled. Carbon.Average lead time: 44 days£14.14Average lead time: 44 days
Specimen Mount, 15mm dia x 15mm (Pk10) AG16281Aluminium specimen Mount, 15mm dia x 15mm for ISI/ABT/TOPCON, also used for JEOL.Average lead time: 13 days£30.13Average lead time: 13 days
Specimen Mount, 25mm dia x 10mm (Pk10) AG16153Aluminium, specimen mount, 25mm dia x 10mm, for AMRAY - special slotted head.Average lead time: 13 days£34.74Average lead time: 13 days
