Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.
- SEM Specimen Stubs, 12.5mm dia, 3.2 x 15mm pin AGG3325SEM Specimen Stubs for AMRAY instruments. 12.5mm dia, pin length 15mm. Aluminium. Special prices valid while stocks last.Average lead time: 44 daysSpecial Price £49.46 was £67.51 You save: £21.66 (27%)Average lead time: 44 days
SEM Specimen Stubs, 32mm dia, re-entrant base AGG305SEM Specimen Stubs for CAMBRIDGE ANALYSIS instruments. 32mm dia, re-entrant base. Aluminium.Average lead time: 44 days£108.22Average lead time: 44 days- SEM Specimen Stubs, 32mm dia, re-entrant base, carbon AGG327SEM Specimen Stubs for CAMBRIDGE ANALYSIS instruments. 32mm dia, re-entrant base. Carbon. Special prices valid while stocks last.In StockSpecial Price £5.80 was £13.36 You save: £9.07 (57%)In Stock
Specimen Mount, 25mm dia x 10mm (Pk10) AG16153Aluminium, specimen mount, 25mm dia x 10mm, for AMRAY - special slotted head.Average lead time: 13 days£34.74Average lead time: 13 days
