Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.
SEM Specimen Stubs, 10mm dia, stub angled 45° AGG3309SEM Specimen Stubs for JEOL instruments. 10mm dia, stub angled 45° chamfer. Aluminium.In Stock£12.67In Stock- SEM Specimen Stubs, 15mm dia, 10mm high, angled 70° chamfer for... AGG3168SEM Specimen Stubs for JEOL instruments. 15mm dia, pin length 10mm, angled 70° chamfer for EBSD.Average lead time: 44 days£57.30Average lead time: 44 days
- SEM Specimen Stubs, 15mm dia, 10mm high, 45° chamfer AGG3167SEM Specimen Stubs for JEOL instruments. 15mm dia, 10mm high, 45° chamfer. Aluminium.Average lead time: 20 days£35.65Average lead time: 20 days
- SEM Specimen Stub, 10mm dia, 10mm high, 45° chamfer AGG3166SEM Specimen Stub for JEOL instruments. 10mm dia, 10mm high, 45° chamfer. Aluminium.In Stock£8.06In Stock
SEM Specimen Stubs, 25mm dia, 16mm high, double angled 90° chamfer AGG3172SEM Specimen Stubs for JEOL instruments. 25mm dia, 16mm high, double angled 90° chamfer. Aluminium.In Stock£11.16In Stock
SEM Specimen Stubs, 25mm dia, 16mm high, angled 45/90° chamfer AGG3171SEM Specimen Stubs for JEOL instruments. 25mm dia, 16mm high, angled 45/90° chamfer. Aluminium.In Stock£11.95In Stock- SEM Specimen Stubs, 25mm dia, 20mm high, angled 45° chamfer AGG3170SEM Specimen Stubs for JEOL instruments. 25mm dia, 20mm high, angled 45° chamfer. Aluminium.In Stock£7.96In Stock
SEM Specimen Stubs, 10mm dia, angled, carbon AGG3424SEM Specimen Stubs for JEOL instruments. 10mm dia, angled. Carbon.Average lead time: 44 days£12.48Average lead time: 44 days
SEM Specimen Stubs, 15mm dia, angled, carbon AGG3425SEM Specimen Stubs for ISI/ABT/TOPCON instruments. 15mm dia, angled. Carbon.Average lead time: 44 days£14.14Average lead time: 44 days
