Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.
Specimen Mount, 25mm dia x 10mm (Pk10) AG16153Aluminium, specimen mount, 25mm dia x 10mm, for AMRAY - special slotted head.Average lead time: 11 days£34.74Average lead time: 11 days
SEM Cylinder Specimen MountsLarge Specimen and Metallurgical Mounts for JEOL microscopes.Average lead time: 18 to 27 daysFrom £3.38
Average lead time: 18 to 27 days
