Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.
- SEM Specimen Stubs, 50mm dia, 10mm high (Pk 20) AGG3387-20SEM Specimen Stubs for JEOL instruments. 50mm dia, 10mm high. Aluminium.In Stock£78.83In Stock
- SEM Specimen Stubs, 32mm dia, 20mm highSEM Specimen Stubs for JEOL instruments. 32mm dia, 20mm high. Aluminium. Special prices valid while stocks last.Average lead time: 20 to 59 days
From £35.96
Average lead time: 20 to 59 days - SEM Specimen Stubs, 12.5mm dia, 5mm high AGG3385SEM Specimen Stubs for JEOL instruments. 12.5mm diameter.In Stock£14.66In Stock
- SEM Specimen Stubs, 12.5mm dia, 10mm high AGG3384SEM Specimen Stubs for JEOL instruments. 12.5mm dia, 10mm high. Aluminium.Average lead time: 44 days£15.63Average lead time: 44 days
- SEM Specimen Stubs, 25mm dia, 16mm high, double angled 90° chamfer AGG3172SEM Specimen Stubs for JEOL instruments. 25mm dia, 16mm high, double angled 90° chamfer. Aluminium.In Stock£11.16In Stock
- SEM Specimen Stubs, 25mm dia, 16mm high, angled 45/90° chamfer AGG3171SEM Specimen Stubs for JEOL instruments. 25mm dia, 16mm high, angled 45/90° chamfer. Aluminium.In Stock£11.95In Stock
- SEM Specimen Stubs, 25mm dia, 20mm high, angled 45° chamfer AGG3170SEM Specimen Stubs for JEOL instruments. 25mm dia, 20mm high, angled 45° chamfer. Aluminium.In Stock£7.96In Stock
- SEM Specimen Stubs, 50mm dia, 5mm highSEM Specimen Stubs for JEOL instruments. 50mm dia, pin length 5mm. Aluminium.Average lead time: 44 days
From £160.78
Average lead time: 44 days - SEM Specimen Stubs, 25mm dia, 10mm high, cylinder stubSEM Specimen Stubs for JEOL instruments. 25mm dia, pin length 10mm, cylinder stubs. Aluminium.Average lead time: 1 day
From £112.05
Average lead time: 1 day - SEM Specimen Stubs, 12.7mm dia, low profile 70° chamfer, 9.5mm pin.... AGG3163SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, low profile 70° chamfer, pin length 8mm. EBSD. Aluminium.Average lead time: 44 days£7.80Average lead time: 44 days
- SEM Specimen Stubs, 12.5mm dia, carbon AGG321SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia. CarbonIn Stock£5.54In Stock
- SEM Specimen Stubs, 9.5mm dia, 9.5mm high, carbonSEM Specimen Stubs for JEOL instruments. 9.5mm dia, 9.5mm high. Carbon.Average lead time: 1 to 20 days
From £1.12
Average lead time: 1 to 20 days - SEM Specimen Stubs, 10mm dia, angled, carbon AGG3424SEM Specimen Stubs for JEOL instruments. 10mm dia, angled. Carbon.Average lead time: 44 days£12.48Average lead time: 44 days
- SEM Specimen Stubs, 12.5mm dia, 10mm high, carbon AGG3427SEM Specimen Stubs for JEOL instruments. 12.5mm dia, 10mm high. Carbon. Special prices valid while stocks last.In StockSpecial Price £2.83 was £4.41 You save: £1.90 (36%)In Stock
- 45˚ SEM Mount 12.7mm Aluminum, grooved edge AG1610145˚ SEM Mount Ø12.7mm for FEI, Tescan, Zeiss (also for Philips, Leo, Cambridge, AMRAY, Leica, CamScan, ETEC) SEM's.Average lead time: 20 days£44.23Average lead time: 20 days
- JEOL 6400/5800 Stage Adapter for Pin Mounts AG15396-10Aluminium dovetail stage adapter for using standard 3.2mm (1/8") pin mounts with the JEOL SEM's.Average lead time: 20 days£360.95Average lead time: 20 days
- SEM Pin Stub 25.4mm diameter, Pk10 AG16144SEM Pin Stub 25.4mm diameter with 9.5mm pin height.In Stock£34.98In Stock
- SEM Pin Stub 32mm diameter, pack of 10 AG16148SEM Pin Stub 32mm diameter with 9.5mm pin height. Pack of 10.Average lead time: 20 days£39.38Average lead time: 20 days
- Thin Specimen Split Mount Holder, M4 AG15335-4Simple but effective design to hold wafers and thin samples up to 3.2mm (1/8").Average lead time: 9 days£42.33Average lead time: 9 days
- SEM Specimen Stubs for Environmental MicroscopyEnvironmental Microscopy specimen stubs. Special prices valid while stocks last.Average lead time: 1 to 29 days
From £87.95
Average lead time: 1 to 29 days - SEM pin mounts with engraved & numbered divisionsSEM pin mounts with engraved & numbered divisions for FEI/Philips, ZEISS/LEO, Cambridge, Leica, Amray, Tescan & Camscan SEMs.Average lead time: 20 to 29 days
From £8.61
Average lead time: 20 to 29 days - SEM Cylinder Specimen MountsLarge Specimen and Metallurgical Mounts for JEOL microscopes.Average lead time: 20 to 29 days
From £3.38
Average lead time: 20 to 29 days - Average lead time: 13 days