Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.
SEM Specimen Stubs - Short PinSEM Specimen Stubs for LEO/ZEISS instruments. 12.5mm dia, pin length 6mm.Average lead time: 1 to 12 daysFrom £27.12
Average lead time: 1 to 12 days
SEM Specimen Stubs, 25mm dia, 3.2 x 6mm pin AGG399FSEM Specimen Stubs for LEO/ZEISS instruments. 25mm dia, pin length 6mm. Aluminium. Pack of 50.In Stock£74.05In Stock
SEM Specimen Stubs, 25.4mm square. Gun residue holders AGG3595SEM Specimen Stubs for forensic science. 25.4mm square (1"). Aluminium.Average lead time: 58 days£85.51Average lead time: 58 days
