Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.
SEM Specimen Stubs, 12.5mm dia, 3.2 x 8mm pinSEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. AGG301, AGG301B and AGG301C.Average lead time: 1 to 27 daysFrom £10.69
Average lead time: 1 to 27 days
SEM Specimen Stubs, 12.5mm dia, 3.2 x 8mm pin, no groove AGG301ASEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, pin length 8mm. No groove. Aluminium.In Stock£29.35In Stock- FEI Microtome 8mm SEM StubA small diameter stub designed for FEI instruments but can also be used with other microscopes. Special prices valid while stocks last.Average lead time: 1 to 44 days
From £14.10
Average lead time: 1 to 44 days 
SEM Specimen Stubs, 12.7mm dia, low profile 45° chamfer, 9.5mm pin AGG3161SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, low profile 45° chamfer, pin length 9.5mm. Aluminium.In Stock£6.71In Stock
SEM Specimen Stubs, 12.7mm dia, low profile 45° chamfer, 6mm pin AGG3161-612.7mm dia, low profile 45° chamfer, pin length 6mm. Aluminium.Average lead time: 44 days£3.99Average lead time: 44 days
SEM Specimen Stubs, 12.7mm dia, 45/90° chamfer, 9.5mm pin AGG3162SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, 45/90° chamfer, pin length 9.5mm. Aluminium.In Stock£5.00In Stock
SEM Specimen Stubs, 12.7mm dia, 45/90° chamfer, 7.8mm pin AGG3160SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, 45/90° chamfer, pin length 7.8mm. Aluminium.In Stock£4.99In Stock- SEM Specimen Stubs, 32mm dia, 8mm pinSEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 32mm dia, pin length 8mm.Average lead time: 1 to 29 days
From £92.96
Average lead time: 1 to 29 days 
SEM Specimen Stubs, 12.5mm dia, 45° chamfer AGG301ESEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 45° chamfer. Aluminium.In Stock£25.30In Stock
SEM Specimen Stubs, 12.5mm dia, 45° chamfer AGG3020SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 45° chamfer. Aluminium.In Stock£27.96In Stock
SEM Specimen Stubs, 12.5mm dia, 20° chamfer AGG3020ASEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 20° chamfer. Aluminium.In Stock£153.83In Stock
SEM Specimen Stubs, 25mm dia, 3.2 x 8mm pinSEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 25mm dia, pin length 3.2 x 8mm.Average lead time: 1 dayFrom £29.02
Average lead time: 1 day
SEM Specimen Stubs, 25mm dia, double 90° chamfer, 9.5mm pin AGG3165SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments.In Stock£11.82In Stock
SEM Specimen Stubs, 25mm dia, 45/90° chamfer, 9.5mm pin AGG3164SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments.In Stock£13.43In Stock
SEM Specimen Stubs, 15mm dia, 12mm high, M4 thread, angled 70°... AGG3313BSEM Specimen Stubs for HITACHI instruments. 15mm dia, 12mm high, M4 thread, angled 70° chamfer for EBSD. Aluminium.In Stock£8.94In Stock
SEM Specimen Stubs, 15mm dia, 10mm high, M4 thread, angled 45/90°... AGG3313DSEM Specimen Stubs for HITACHI instruments. 15mm dia, 10mm high, M4 thread, angled 45/90° chamfer. Aluminium.Average lead time: 44 days£11.87Average lead time: 44 days
SEM Specimen Stubs, 15mm dia, 10mm high, M4 thread, angled 45°... AGG3313ASEM Specimen Stubs for HITACHI instruments. 15mm diameter.Average lead time: 13 days£8.87Average lead time: 13 days
SEM Specimen Stubs, 25mm dia, threaded pin AGG3025SEM Specimen Stubs for HITACHI instruments. 25mm dia, threaded pin. Aluminium.In Stock£252.35In Stock
SEM Specimen Stubs, 32mm dia, 10mm high, M4 thread AGG3318SEM Specimen Stubs for HITACHI instruments. 32mm dia, 10mm high, M4 thread. Aluminium.Average lead time: 44 days£117.37Average lead time: 44 days
SEM Specimen Stubs, 15mm dia, 6mm high, M4 thread AGG3313SEM Specimen Stubs for HITACHI instruments. 15mm dia, 6mm high, M4 thread. Aluminium. Pack of 50.In Stock£70.51In Stock
SEM Specimen Stubs, 12.7mm dia, low profile 70° chamfer, 9.5mm pin.... AGG3163SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, low profile 70° chamfer, pin length 8mm. EBSD. Aluminium.Average lead time: 44 days£7.80Average lead time: 44 days
SEM Specimen Stubs, 12.5mm dia, carbon AGG321SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia. CarbonIn Stock£5.54In Stock- SEM Specimen Stubs, 15mm dia, 6mm high, M4 thread, carbon AGG3423SEM Specimen Stubs for HITACHI instruments. 15mm dia, 6mm high, M4 thread. Carbon. Special prices valid while stocks last.In StockSpecial Price £3.54 was £6.73 You save: £3.83 (47%)In Stock
45˚ SEM Mount 12.7mm Aluminum, grooved edge AG1610145˚ SEM Mount Ø12.7mm for FEI, Tescan, Zeiss (also for Philips, Leo, Cambridge, AMRAY, Leica, CamScan, ETEC) SEM's.Average lead time: 20 days£44.23Average lead time: 20 days
