Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.
SEM Specimen Stubs, 9.5mm dia, 9.5mm high, carbonSEM Specimen Stubs for JEOL instruments. 9.5mm dia, 9.5mm high. Carbon.Average lead time: 1 to 19 daysFrom £1.12
Average lead time: 1 to 19 days- SEM Specimen Stubs, 15mm dia, 6mm high, M4 thread, carbon AGG3423SEM Specimen Stubs for HITACHI instruments. 15mm dia, 6mm high, M4 thread. Carbon. Special prices valid while stocks last.In StockSpecial Price £3.54 was £6.73 You save: £3.83 (47%)In Stock
SEM Specimen Stubs, 10mm dia, angled, carbon AGG3424SEM Specimen Stubs for JEOL instruments. 10mm dia, angled. Carbon.Average lead time: 43 days£12.48Average lead time: 43 days
Multi Holder for 6 Pin Stubs, M4 AG15411Multi holder accommodates up to six standard 12.7mm pin stubs.Average lead time: 12 days£135.05Average lead time: 12 days
Multi Holder for 12 Pin Stubs, M4 AG15417Multi holder accommodates up to 12 standard 12.7mm pin stubs.Average lead time: 12 days£180.08Average lead time: 12 days
