Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.
Rotating SEM Specimen HolderA unique rotating SEM Specimen holder allows a sample to be pinned and rotated through 360° which, combined with an electron absorption chamber, yields clear images from any angle on a completely black background.Average lead time: 26 daysFrom £204.90
Average lead time: 26 days
Silicon MountsSuper smooth, polished silicon mounts are ideal for applications where the machined surface of aluminium or carbon stubs can cause interference.Average lead time: 1 to 12 daysFrom £63.04
Average lead time: 1 to 12 days
Ink Pen for SEM AGG3344Fine point writing pen which leaves a mark that can be read in the electron beam of the SEM.Average lead time: 12 days£4.51Average lead time: 12 days
