Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.
SEM Specimen Stubs, 12.5mm dia, 5mm high AGG3385SEM Specimen Stubs for JEOL instruments. 12.5mm diameter.In Stock£14.66In Stock
SEM Specimen Stubs, 12.5mm dia, 10mm high AGG3384SEM Specimen Stubs for JEOL instruments. 12.5mm dia, 10mm high. Aluminium.Average lead time: 44 days£15.63Average lead time: 44 days- SEM Specimen Stubs, 12.5mm dia, 10mm high, carbon AGG3427SEM Specimen Stubs for JEOL instruments. 12.5mm dia, 10mm high. Carbon. Special prices valid while stocks last.In StockSpecial Price £2.83 was £4.41 You save: £1.90 (36%)In Stock
