Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.
SEM Specimen Stubs, 25mm dia, 6mm high, M4 thread AGG3377SEM Specimen Stubs for HITACHI instruments. 25mm dia, 6mm high, M4 thread. Aluminium.In Stock£62.19In Stock
SEMClip Specimen Mounts, Cylinder mounts with M4 Thread, 25mmCylinder mount SEMClips for Hitachi SEMs, with M4 thread.Average lead time: 1 to 13 daysFrom £36.07
Average lead time: 1 to 13 days
SEM cylinder mounts with engraved & numbered divisions for...SEM mounts for Hitachi SEMs with engraved and numbered divisions to accommodate multiple smaller samples.Average lead time: 20 daysFrom £12.00
Average lead time: 20 days
