Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.
SEMClip Specimen Mounts, Cylinder mounts with M4 Thread, 25mmCylinder mount SEMClips for Hitachi SEMs, with M4 thread.Average lead time: 1 to 13 daysFrom £36.07
Average lead time: 1 to 13 days
SEMClip Specimen Mounts, Cylinder mounts with for JEOL SEMs, 25mm,...Cylinder mount SEMClips for JEOL SEMs.Average lead time: 13 daysFrom £43.21
Average lead time: 13 days
SEMClip Specimen Mounts, Pin Stub mounts, 25mm25mm diameter SEMClip mounts, available with 1, 2 or 3 clips.Average lead time: 1 dayFrom £35.62
Average lead time: 1 day
SEMClip Specimen Mounts, Cylinder mounts with for JEOL SEMs, 25mmCylinder mount SEMClips for JEOL SEMs.Average lead time: 13 to 20 daysFrom £30.38
Average lead time: 13 to 20 days
