SEM Specimen stubs & mounts

Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.

SEM Specimen Stubs, 25mm dia, double 90° chamfer, 9.5mm pin AGG3165
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments.
Average lead time: 33 days
£11.82
Average lead time: 33 days

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SEM Specimen Stubs, 25mm dia, 45/90° chamfer, 9.5mm pin AGG3164
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments.
In Stock
£13.43
In Stock

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SEM Specimen Stubs, 25mm dia, threaded pin AGG3025
SEM Specimen Stubs for HITACHI instruments. 25mm dia, threaded pin. Aluminium.
In Stock
£252.35
In Stock

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Hitachi SEM Cylinder Specimen Mounts
Cylinder specimen mount for Hitachi TM3030/TM3000/TM1000 Tabletop SEM's. 15mm, 25mm and 35mm diameter.
Average lead time: 1 to 28 days
From £18.85
Average lead time: 1 to 28 days