SEM Specimen stubs & mounts

Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.

SEM Specimen Stubs, 25mm dia, double 90° chamfer, 9.5mm pin AGG3165
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments.
In Stock
£11.82
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SEM Specimen Stubs, 25mm dia, 45/90° chamfer, 9.5mm pin AGG3164
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments.
In Stock
£13.43
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SEM Pin Stub 25.4mm diameter, Pk10 AG16144
SEM Pin Stub 25.4mm diameter with 9.5mm pin height.
In Stock
£34.98
In Stock

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SEM pin mounts with engraved & numbered divisions
SEM pin mounts with engraved & numbered divisions for FEI/Philips, ZEISS/LEO, Cambridge, Leica, Amray, Tescan & Camscan SEMs.
Average lead time: 20 to 29 days
From £8.61
Average lead time: 20 to 29 days