SEM Specimen stubs & mounts

Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.

SEM Specimen Stubs, 50mm dia, 10mm high (Pk 20) AGG3387-20
SEM Specimen Stubs for JEOL instruments. 50mm dia, 10mm high. Aluminium.
In Stock
£78.83
In Stock

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SEM Specimen Stubs, 50mm dia, 5mm high
SEM Specimen Stubs for JEOL instruments. 50mm dia, pin length 5mm. Aluminium.
Average lead time: 44 days
From £160.78
Average lead time: 44 days
SEMClip Specimen Mounts, Pin Stub mounts, 50mm
Pin stub versions of SEMClip mounts are available in 18 to 50mm diameters, and can be used with all SEMs using pin stubs.
Average lead time: 1 to 13 days
From £39.89
Average lead time: 1 to 13 days
SEM Cylinder Specimen Mounts
Large Specimen and Metallurgical Mounts for JEOL microscopes.
Average lead time: 20 to 29 days
From £3.38
Average lead time: 20 to 29 days