Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.
SEM Specimen Stubs, 12.7mm dia, low profile 45° chamfer, 9.5mm pin AGG3161SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, low profile 45° chamfer, pin length 9.5mm. Aluminium.In Stock£6.71In Stock
SEM Specimen Stubs, 12.7mm dia, low profile 45° chamfer, 6mm pin AGG3161-612.7mm dia, low profile 45° chamfer, pin length 6mm. Aluminium.Average lead time: 44 days£3.99Average lead time: 44 days
SEM Specimen Stubs, 12.7mm dia, 45/90° chamfer, 9.5mm pin AGG3162SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, 45/90° chamfer, pin length 9.5mm. Aluminium.In Stock£5.00In Stock
SEM Specimen Stubs, 12.7mm dia, 45/90° chamfer, 7.8mm pin AGG3160SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, 45/90° chamfer, pin length 7.8mm. Aluminium.In Stock£4.99In Stock
SEM Specimen Stubs, 12.7mm dia, low profile 70° chamfer, 9.5mm pin.... AGG3163SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, low profile 70° chamfer, pin length 8mm. EBSD. Aluminium.Average lead time: 44 days£7.80Average lead time: 44 days
SEM pin mounts with engraved & numbered divisionsSEM pin mounts with engraved & numbered divisions for FEI/Philips, ZEISS/LEO, Cambridge, Leica, Amray, Tescan & Camscan SEMs.Average lead time: 20 to 29 daysFrom £8.61
Average lead time: 20 to 29 days
