Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.
SEM Specimen Stubs, 10mm dia, stub angled 45° AGG3309SEM Specimen Stubs for JEOL instruments. 10mm dia, stub angled 45° chamfer. Aluminium.In Stock£12.67In Stock
SEM Specimen Stubs, 10mm dia, 5mm high, for JEOL heating stage AGG306ASEM Specimen Stubs for JEOL instruments. 10mm diameter.In Stock£14.51In Stock
SEM Specimen Stubs, 10mm dia, 10mm highSEM Specimen Stubs for JEOL instruments. 10mm dia, 10mm high.Average lead time: 1 dayFrom £17.25
Average lead time: 1 day- SEM Specimen Stub, 10mm dia, 10mm high, 45° chamfer AGG3166SEM Specimen Stub for JEOL instruments. 10mm dia, 10mm high, 45° chamfer. Aluminium.In Stock£8.06In Stock
SEM Specimen Stubs, 9.5mm dia, 9.5mm high, carbonSEM Specimen Stubs for JEOL instruments. 9.5mm dia, 9.5mm high. Carbon.Average lead time: 1 to 19 daysFrom £1.12
Average lead time: 1 to 19 days
SEM Specimen Stubs, 10mm dia, angled, carbon AGG3424SEM Specimen Stubs for JEOL instruments. 10mm dia, angled. Carbon.Average lead time: 43 days£12.48Average lead time: 43 days- SEM Specimen Stubs for Environmental MicroscopyEnvironmental Microscopy specimen stubs. Special prices valid while stocks last.Average lead time: 1 to 28 days
From £87.95
Average lead time: 1 to 28 days
