Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.
SEM Specimen Stubs, 15mm dia, 5mm highSEM Specimen Stubs for JEOL instruments. 15mm dia, pin length 5mm. Aluminium.Average lead time: 54 daysFrom £35.86
Average lead time: 54 days
Hitachi SEM Cylinder Specimen MountsCylinder specimen mount for Hitachi TM3030/TM3000/TM1000 Tabletop SEM's. 15mm, 25mm and 35mm diameter.Average lead time: 1 to 29 daysFrom £18.85
Average lead time: 1 to 29 days
