Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.
SEMClip Specimen Mounts, Cylinder mounts with M4 Thread, 15mmCylinder mount SEMClips for Hitachi SEMs, with M4 thread. 15mm diameter.Average lead time: 27 daysFrom £33.28
Average lead time: 27 days
Thin Specimen Split Mount Holder, M4 AG15335-4Simple but effective design to hold wafers and thin samples up to 3.2mm (1/8").Average lead time: 9 days£42.33Average lead time: 9 days
Specimen Mount, 15mm dia x 15mm (Pk10) AG16281Aluminium specimen Mount, 15mm dia x 15mm for ISI/ABT/TOPCON, also used for JEOL.Average lead time: 13 days£30.13Average lead time: 13 days
Hitachi SEM Cylinder Specimen MountsCylinder specimen mount for Hitachi TM3030/TM3000/TM1000 Tabletop SEM's. 15mm, 25mm and 35mm diameter.Average lead time: 1 to 29 daysFrom £18.85
Average lead time: 1 to 29 days
