Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.
- SEM Specimen Stubs, 15mm dia, 10mm high, angled 70° chamfer for... AGG3168SEM Specimen Stubs for JEOL instruments. 15mm dia, pin length 10mm, angled 70° chamfer for EBSD.Average lead time: 44 days£57.30Average lead time: 44 days
- SEM Specimen Stubs, 15mm dia, 10mm high, 45° chamfer AGG3167SEM Specimen Stubs for JEOL instruments. 15mm dia, 10mm high, 45° chamfer. Aluminium.Average lead time: 20 days£35.65Average lead time: 20 days
SEM Specimen Stubs, 15mm dia, 5mm highSEM Specimen Stubs for JEOL instruments. 15mm dia, pin length 5mm. Aluminium.Average lead time: 54 daysFrom £35.86
Average lead time: 54 days
SEM Specimen Stubs, 15mm dia, 12mm high, M4 thread, angled 70°... AGG3313BSEM Specimen Stubs for HITACHI instruments. 15mm dia, 12mm high, M4 thread, angled 70° chamfer for EBSD. Aluminium.In Stock£8.94In Stock
SEM Specimen Stubs, 15mm dia, 10mm high, M4 thread, angled 45/90°... AGG3313DSEM Specimen Stubs for HITACHI instruments. 15mm dia, 10mm high, M4 thread, angled 45/90° chamfer. Aluminium.Average lead time: 44 days£11.87Average lead time: 44 days
SEM Specimen Stubs, 15mm dia, 10mm high, M4 thread, angled 45°... AGG3313ASEM Specimen Stubs for HITACHI instruments. 15mm diameter.Average lead time: 13 days£8.87Average lead time: 13 days
SEM Specimen Stubs, 15mm dia, 6mm high, M4 thread AGG3313SEM Specimen Stubs for HITACHI instruments. 15mm dia, 6mm high, M4 thread. Aluminium. Pack of 50.In Stock£70.51In Stock- SEM Specimen Stubs, 15mm dia, 6mm high, M4 thread, carbon AGG3423SEM Specimen Stubs for HITACHI instruments. 15mm dia, 6mm high, M4 thread. Carbon. Special prices valid while stocks last.In StockSpecial Price £3.54 was £6.73 You save: £3.83 (47%)In Stock
SEM Specimen Stubs, 15mm dia, angled, carbon AGG3425SEM Specimen Stubs for ISI/ABT/TOPCON instruments. 15mm dia, angled. Carbon.Average lead time: 44 days£14.14Average lead time: 44 days
SEMClip Specimen Mounts, Cylinder mounts with M4 Thread, 15mmCylinder mount SEMClips for Hitachi SEMs, with M4 thread. 15mm diameter.Average lead time: 27 daysFrom £33.28
Average lead time: 27 days
Thin Specimen Split Mount Holder, M4 AG15335-4Simple but effective design to hold wafers and thin samples up to 3.2mm (1/8").Average lead time: 9 days£42.33Average lead time: 9 days
Specimen Mount, 15mm dia x 15mm (Pk10) AG16281Aluminium specimen Mount, 15mm dia x 15mm for ISI/ABT/TOPCON, also used for JEOL.Average lead time: 13 days£30.13Average lead time: 13 days
Hitachi SEM Cylinder Specimen MountsCylinder specimen mount for Hitachi TM3030/TM3000/TM1000 Tabletop SEM's. 15mm, 25mm and 35mm diameter.Average lead time: 1 to 29 daysFrom £18.85
Average lead time: 1 to 29 days
