Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.
SEMClip Specimen Mounts, Pin Stub mounts, 18mmPin stub versions of SEMClip mounts are available in 18 to 50mm diameters, and can be used with all SEMs using pin stubs.Average lead time: 8 daysFrom £34.40
Average lead time: 8 days
