Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.
- SEM Specimen Stubs, 32mm dia, 8mm pinSEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 32mm dia, pin length 8mm.Average lead time: 1 to 28 days
From £92.96
Average lead time: 1 to 28 days 
SEM Specimen Stubs, 32mm dia, re-entrant base AGG305SEM Specimen Stubs for CAMBRIDGE ANALYSIS instruments. 32mm dia, re-entrant base. Aluminium.Average lead time: 43 days£108.22Average lead time: 43 days- SEM Specimen Stubs, 32mm dia, re-entrant base, carbon AGG327SEM Specimen Stubs for CAMBRIDGE ANALYSIS instruments. 32mm dia, re-entrant base. Carbon. Special prices valid while stocks last.In StockSpecial Price £5.80 was £13.36 You save: £9.07 (57%)In Stock
SEM Pin Stub 32mm diameter, pack of 10 AG16148SEM Pin Stub 32mm diameter with 9.5mm pin height. Pack of 10.Average lead time: 19 days£39.38Average lead time: 19 days
SEM pin mounts with engraved & numbered divisionsSEM pin mounts with engraved & numbered divisions for FEI/Philips, ZEISS/LEO, Cambridge, Leica, Amray, Tescan & Camscan SEMs.Average lead time: 19 to 28 daysFrom £8.61
Average lead time: 19 to 28 days
