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SEM Specimen Stubs, 12.5mm dia, 3.2 x 8mm pin, no groove

SEM Specimen Stubs, 12.5mm dia, 3.2 x 8mm pin, no groove

SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, pin length 8mm. No groove. Aluminium.

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Description

Product Description

SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, pin length 8mm. No groove. Aluminium.
Pack of 100.

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