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SEM Specimen Stubs, 15mm dia, angled, carbon

SEM Specimen Stubs, 15mm dia, angled, carbon

SEM Specimen Stubs for ISI/ABT/TOPCON instruments. 15mm dia, angled. Carbon.

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Description

Product Description

SEM Specimen Stubs for ISI/ABT/TOPCON instruments. 15mm dia, angled. Carbon.
If the background radiation from an aluminium stub is undesirable, a stub made of spectroscopically pure carbon may be used.
Supplied individually.

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