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SEM Specimen Stubs, 10mm dia, angled, carbon

SEM Specimen Stubs, 10mm dia, angled, carbon

SEM Specimen Stubs for JEOL instruments. 10mm dia, angled. Carbon.

All prices exclude VAT.

Description

Product Description

SEM Specimen Stubs for JEOL instruments. 10mm dia, angled. Carbon.
If the background radiation from an aluminium stub is undesirable, a stub made of spectroscopically pure carbon may be used.
Supplied individually.

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PRICE & AVAILABILITY: Please note that while we are working closely with our suppliers to minimise any global supply chain issues, prices and availability may be subject to change at short notice.