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Agar Scientific specialises in producing a wide range of specimens specifically for SEM test and calibration where quantification or high resolution results are required.

 

SEM resolution is tested in terms of a combination of criteria, namely resolved gaps and the number of grey levels in the image. This is to ensure that the resolution has not been distorted by using the contrast to maximise visibility of edges. High resolution images ideally should show fine detail together with a lack of noise, evidenced by a good range of grey levels.

For assessments of resolution in scanning electron microscopes, we have developed a range of gold on carbon and tin on carbon test specimens. These specimens are suitable for tests of SE and BSE imaging and also for chemical mapping in high resolution systems such as in Auger scanning instruments. The specimens can be supplied on most types of specimen stub.

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6 products available

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  1. Critical Dimension Standards, 2.0mm to 1μm, Certified
    Economically priced, fully-featured Critical Dimension Standards for calibration over 2.0mm to 1μm for a magnification range from 10x - 20,000x. Certified. 
    Average lead time: 13 to 29 days

    From £612.63

    Average lead time: 13 to 29 days
  2. Critical Dimension Standards, 2.0mm to 1μm, ISO Certified
    Economically priced, fully-featured Critical Dimension Standards for calibration over 2.0mm to 1μm for a magnification range from 10x - 20,000x. ISO Certified. 
    Call for leadtime

    From £937.68

    Call for leadtime
  3. Critical Dimension Standards, 2.0mm to 1μm, Traceable
    Economically priced, fully-featured Critical Dimension Standards for calibration over 2.0mm to 1μm for a magnification range from 10x - 20,000x. Traceable. 
    Call for leadtime

    From £70.63

    Call for leadtime
  4. Bi-Directional Critical Dimension Standards, 2.0mm to 1μm, Certified
    Economically priced yet fully-featured Bi-Directional Critical Dimension Standard with X and Y axis for calibration over a wide measurement range. 2.0mm to 1µm for a magnification range from 10x - 20,000x. Certified. 
    Average lead time: 1 to 29 days

    From £908.26

    Average lead time: 1 to 29 days
  5. Bi-Directional Critical Dimension Standards, 2.0mm to 1μm, ISO...
    Economically priced yet fully-featured Bi-Directional Critical Dimension Standard with X and Y axis for calibration over a wide measurement range. 2.0mm to 1µm for a magnification range from 10x - 20,000x. ISO Certified. 
    Average lead time: 1 to 29 days

    From £1,646.91

    Average lead time: 1 to 29 days
  6. Bi-Directional Critical Dimension Standards, 2.0mm to 1μm, Traceable
    Economically priced yet fully-featured Bi-Directional Critical Dimension Standard with X and Y axis for calibration over a wide measurement range. 2.0mm to 1µm for a magnification range from 10x - 20,000x. Traceable. 
    Average lead time: 29 days

    From £103.48

    Average lead time: 29 days
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PRICE & AVAILABILITY: Please note that while we are working closely with our suppliers to minimise any global supply chain issues, prices and availability may be subject to change at short notice.
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