
Tin on Carbon AGS1937 - Universal Resolution Specimen
Universal resolution test specimen with a particle size range from approximately <5nm - 30um.
Universal resolution test specimen with a particle size range from approximately <5nm - 30um.
This tin on carbon test specimen has a very wide size range of tin spheres which give high contrast when imaged in the SEM. The largest spheres can be used for basic column alignment at low magnification; intermediate sized spheres are useful for monitoring image shift when changing operating parameters or resolution checking at low kV; and the smallest spheres can be used for resolution checking and astigmatism correction at the very highest magnifications.
* When requesting a quote for AGS1937D, please specify the stub you would like from our catalogue, or provide information on the stub you would like to send to us for mounting.
*All unless otherwise specified.
Type | Mount | Part Code |
AGSXXXX | Aluminium specimen stub, 12.5 mm diameter, 3.2 x 8 mm pin | AGG301 |
AGSXXXXA | JEOL specimen stub, 10 mm diameter, 10 mm height | AGG306 |
AGSXXXXB | ISI specimen stub, 15 mm diameter, 10 mm height | AGG307 |
AGSXXXXC | Hitachi specimen stub, 15 mm diameter, 6 mm height, M4 thread | AGG3313 |
AGSXXXXD | Customer specified stub from our catalogue, or provide information on the stub you will send for mounting | - |
AGSXXXXE | JEOL specimen stub, 12.5 mm diameter, 10 mm height | AGG3384 |
AGSXXXXT | Unmounted, thin carbon disc | - |
AGSXXXXU | Unmounted | - |
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