
Gold on Carbon AGS168 - Resolution Test Specimen
Resolution test specimen with a particle size range from approximately 5 - 150nm.
Resolution test specimen with a particle size range from approximately 5 - 150nm.
This specimen has a particle size range from approximately 5 - 150nm. Each specimen has a square grid pattern with large crystals in the centre of each grid square and very fine crystals at the edges of each grid (as illustrated). Medium and high resolution point separation tests may be performed on the same specimen. In addition, the larger crystals show facets which allow an assessment of the grey level reproduction available at high resolution.
* When requesting a quote for AGS168D, please specify the stub you would like from our catalogue, or provide information on the stub you would like to send to us for mounting.
*All unless otherwise specified.
Type | Mount | Part Code |
AGSXXXX | Aluminium specimen stub, 12.5 mm diameter, 3.2 x 8 mm pin | AGG301 |
AGSXXXXA | JEOL specimen stub, 10 mm diameter, 10 mm height | AGG306 |
AGSXXXXB | ISI specimen stub, 15 mm diameter, 10 mm height | AGG307 |
AGSXXXXC | Hitachi specimen stub, 15 mm diameter, 6 mm height, M4 thread | AGG3313 |
AGSXXXXD | Customer specified stub from our catalogue, or provide information on the stub you will send for mounting | - |
AGSXXXXE | JEOL specimen stub, 12.5 mm diameter, 10 mm height | AGG3384 |
AGSXXXXS | Short pin specimen stub, 12.5 mm diameter, 3.2 x 6 mm pin | AGG301F |
AGSXXXXT | Unmounted, thin carbon disc | - |
AGSXXXXU | Unmounted | - |
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