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2-D holographic array standards

2-D holographic array standards for simultaneous calibration of X and Y axes.

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Description

Name & Code

Grouped product items
Code & Description	Availability	Price	Qty
AGF7050 AFM 144nm reference standards, certified, non-traceable, mounted on disc Loading...	Loading...	POA	POA
AGF7051 AFM 144nm reference standards, certified (certificate provided), traceable, mounted on disc Loading...	Loading...	POA	POA
AGF7052 AFM 300nm reference standards, certified, non-traceable, mounted on disc Loading...	Loading...	POA	POA

Product Description

These 2-D holographic array standards for simultaneous calibration of X and Y axes have unique characteristics that make them especially easy to use. The pitch is less than 500nm and the pattern covers the entire die so there is no need to hunt for the scan area. The array of bumps means that the image contrast is high even when the probe tip is slightly dull. The patterns are durable and allow for high contrast scanning in contact mode so that calibration and measurements are faster. They can be used in contact, intermittent contact (TappingMode™) and other modes with image sizes from 250nm to 10mm.

Mounted on 12mm steel disc.

Delivery & Returns

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PRICE & AVAILABILITY: Please note that while we are working closely with our suppliers to minimise any global supply chain issues, prices and availability may be subject to change at short notice.