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SEM Specimen Stubs

We offer a comprehensive range of SEM specimen stubs for a wide range of instruments, including Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss.

With over 100 options, we have in our range:

  • Standard pin stubs
  • Angled stubs
  • Cylinder stubs
  • Low profile stubs
  • M4 threaded stubs

Our stubs are predominantly machined from free cutting aluminium, however we also offer high purity aluminium, brass, carbon or copper stubs. Stubs pre-mounted with carbon tabs are also available.

For more information, visit our product pages or contact us: [email protected]