SEM Specimen Stubs

We offer a comprehensive range of SEM specimen stubs for a wide range of instruments, including Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss.

With over 100 options, we have in our range:

• Standard pin stubs
• Angled stubs
• Cylinder stubs
• Low profile stubs
• M4 threaded stubs

Our stubs are predominantly machined from free cutting aluminium, however we also offer high purity aluminium, brass, carbon or copper stubs. Stubs pre-mounted with carbon tabs are also available.

For more information, visit our product pages or contact us: [email protected]