SEM Specimen Stubs, 32mm dia, 5mm high
SEM Specimen Stubs for JEOL instruments. 32mm dia, 5mm high. Aluminium.
All prices exclude VAT.LEAD TIMES: Average Lead Times are shown individually in days for any products not currently in stock. Whilst we are working closely with our suppliers to minimise the impact of global supply chain issues, and regularly update our product prices and lead times, some are subject to change due to supply chain fluctuations.
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