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SEM Specimen Stubs, 25mm dia, 16mm high, double angled 90° chamfer

SEM Specimen Stubs, 25mm dia, 16mm high, double angled 90° chamfer

SEM Specimen Stubs for JEOL instruments. 25mm dia, 16mm high, double angled 90° chamfer. Aluminium.

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Product Description

SEM Specimen Stubs for JEOL instruments. 25mm dia, 16mm high, double angled 90° chamfer. Aluminium.

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PRICE & AVAILABILITY: Please note that while we are working closely with our suppliers to minimise any global supply chain issues, prices and availability may be subject to change at short notice.