
These tungsten probe tips for the AutoProbe 300 nanomanipulator have been designed to allow speedy in situ probe tip exchange and are compatible with the Short-Cut tool. The AP250 probe tip is also compatible with the Short-Cut tool for direct conversion to TEM grids. In situ tungsten probe tips for an AutoProbe 300 fitted to an FEI Helios 1200 are also available.
The AP250 probe point holder has been designed to hold the AP250 tungsten probe tip (AGJ413). It is compatible with the Short-Cut tool for direct conversion to TEM grids. The holder is supplied with a storage vial.
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