PELCO Tripod Polisher
The PELCO Tripod Polisher 590 can be used to prepare a sample for both SEM and TEM cross-sectional analysis.
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Product DescriptionTechnical DataDelivery & Returns
The PELCO® Tripod Polisher™ 590 can be used to prepare a sample for both TEM and SEM cross-sectional analysis.
For TEM samples, this technique has been used successfully to limit ion milling times to less than 15 minutes and, in some cases, has eliminated the need for ion milling. Although this technique was designed for preparing semiconductor cross-sections, it has been used to prepare both plain-view and cross-section samples from such diverse materials as ceramics, composites, metals, and geological samples.
Features & Benefits
- Precise cross-sectioning at the TEM level
- Repeatable and rapid production of TEM samples
- Reduces ion milling time to minutes as opposed to hours
- Produces large thin areas over the entire specimen
Each Tripod Polisher is supplied with a base with 3 Micrometer Assemblies, Hex Driver Set, Sample Mounting Wax, Case and accessories listed under technical information.
We have a range of replacement and optional accessories available, please visit our accessories page.
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