292nm pitch resolution reference standards for AFM
292nm pitch reference standard for very high resolution calibration of AFM.
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Product DescriptionDelivery & Returns
The 292nm pitch is accurate to ±1%. The surface structure is titanium lines on silicon. The line height is approximately 30nm with a line width of 130nm (not calibrated).
For AFM it can be used in contact, tapping, and other modes, with image sizes from 500nm to 20µm.
It can be supplied either non-certified, or with a non-traceable manufacturer’s certificate stating average pitch based on batch measurements.
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