Mag*I*Cal calibration standard
Using this standard, the three major instrument calibrations: magnification, camera constant for indexing diffraction patterns and image/diffraction pattern rotation, can all be carried out using a single specimen.
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Using this standard, the three major instrument calibrations: magnification, camera constant for indexing diffraction patterns and image/diffraction pattern rotation, can all be carried out using a single specimen. The specimen is a single crystal consisting of a series of clearly defined layers of Si and SiGe which have been grown by molecular beam epitaxy. The thicknesses and spacings of these layers have been directly referenced to the (111) lattice spacing of silicon. The layer spacings are designed so that the sample can be used to calibrate almost the entire magnification range in a TEM from x1000 to x1,000,000. The single crystal nature means that it can also be used for camera constant and diffraction pattern rotation calibration. The specimen is in the form of an ion beam thinned wedge and is very stable under the electron beam. A certificate of calibration is also provided.
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