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SEM Specimen Stub, 10mm dia, 10mm high, 45° chamfer

SEM Specimen Stub for JEOL instruments. 10mm dia, 10mm high, 45° chamfer. Aluminium.
All prices exclude VAT.
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AGG3166
In Stock
£7.82
Product Description

SEM Specimen Stub for JEOL instruments. 10mm dia, 10mm high, 45° chamfer. Aluminium.

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