Individual silicon test specimens are calibrated to a guaranteed accuracy of better than 1% and are supplied with a laboratory certificate as documented proof. The equipment is checked against a reference specimen calibrated by the NPL by laser beam interferometry.
Also see our recalibration service.
The silicon specimen can be supplied on any stub.
* When requesting a quote for AGS1932D-CT, please specify the stub you would like from our catalogue, or provide information on the stub you would like to send to us for mounting.
SEM Specimen mounts selection guide
*All unless otherwise specified.
Type | Mount | Part Code |
AGSXXXX | Aluminium specimen stub, 12.5 mm diameter, 3.2 x 8 mm pin | AGG301 |
AGSXXXXA | JEOL specimen stub, 10 mm diameter, 10 mm height | AGG306 |
AGSXXXXB | ISI specimen stub, 15 mm diameter, 10 mm height | AGG307 |
AGSXXXXC | Hitachi specimen stub, 15 mm diameter, 6 mm height, M4 thread | AGG3313 |
AGSXXXXD | Customer specified stub from our catalogue, or provide information on the stub you will send for mounting | - |
AGSXXXXE | JEOL specimen stub, 12.5 mm diameter, 10 mm height | AGG3384 |
AGSXXXXS | Short pin specimen stub, 12.5 mm diameter, 3.2 x 6 mm pin | AGG301F |
AGSXXXXT | Unmounted, thin carbon disc | - |
AGSXXXXU | Unmounted | - |