Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.
SEM Specimen Stubs, 12.7mm dia, low profile 45° chamfer, 9.5mm pin AGG3161SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, low profile 45° chamfer, pin length 9.5mm. Aluminium.In StockPOA
In Stock
SEM Specimen Stubs, 12.7mm dia, low profile 45° chamfer, 6mm pin AGG3161-612.7mm dia, low profile 45° chamfer, pin length 6mm. Aluminium.Average lead time: 42 daysPOA
Average lead time: 42 days
SEM Specimen Stubs, 12.7mm dia, 45/90° chamfer, 9.5mm pin AGG3162SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, 45/90° chamfer, pin length 9.5mm. Aluminium.Average lead time: 27 daysPOA
Average lead time: 27 days
SEM Specimen Stubs, 12.7mm dia, 45/90° chamfer, 7.8mm pin AGG3160SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, 45/90° chamfer, pin length 7.8mm. Aluminium.In StockPOA
In Stock
SEM Specimen Stubs, 12.5mm dia, 45° chamfer AGG301ESEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 45° chamfer. Aluminium.In StockPOA
In Stock
SEM Specimen Stubs, 12.5mm dia, 45° chamfer AGG3020SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 45° chamfer. Aluminium.In StockPOA
In Stock
SEM Specimen Stubs, 12.5mm dia, 20° chamfer AGG3020ASEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia, 20° chamfer. Aluminium.In StockPOA
In Stock
SEM Specimen Stubs, 10mm dia, stub angled 45° AGG3309SEM Specimen Stubs for JEOL instruments. 10mm dia, stub angled 45° chamfer. Aluminium.In StockPOA
In Stock
SEM Specimen Stubs, 25mm dia, double 90° chamfer, 9.5mm pin AGG3165SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments.Average lead time: 32 daysPOA
Average lead time: 32 days
SEM Specimen Stubs, 25mm dia, 45/90° chamfer, 9.5mm pin AGG3164SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments.In StockPOA
In Stock- SEM Specimen Stubs, 15mm dia, 10mm high, angled 70° chamfer for... AGG3168SEM Specimen Stubs for JEOL instruments. 15mm dia, pin length 10mm, angled 70° chamfer for EBSD.Average lead time: 42 days
POA
Average lead time: 42 days - SEM Specimen Stubs, 15mm dia, 10mm high, 45° chamfer AGG3167SEM Specimen Stubs for JEOL instruments. 15mm dia, 10mm high, 45° chamfer. Aluminium.Average lead time: 18 days
POA
Average lead time: 18 days - SEM Specimen Stub, 10mm dia, 10mm high, 45° chamfer AGG3166SEM Specimen Stub for JEOL instruments. 10mm dia, 10mm high, 45° chamfer. Aluminium.In Stock
POA
In Stock 
SEM Specimen Stubs, 25mm dia, 16mm high, double angled 90° chamfer AGG3172SEM Specimen Stubs for JEOL instruments. 25mm dia, 16mm high, double angled 90° chamfer. Aluminium.In StockPOA
In Stock
SEM Specimen Stubs, 25mm dia, 16mm high, angled 45/90° chamfer AGG3171SEM Specimen Stubs for JEOL instruments. 25mm dia, 16mm high, angled 45/90° chamfer. Aluminium.In StockPOA
In Stock- SEM Specimen Stubs, 25mm dia, 20mm high, angled 45° chamfer AGG3170SEM Specimen Stubs for JEOL instruments. 25mm dia, 20mm high, angled 45° chamfer. Aluminium.In Stock
POA
In Stock 
SEM Specimen Stubs, 12.7mm dia, low profile 70° chamfer, 9.5mm pin.... AGG3163SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, low profile 70° chamfer, pin length 8mm. EBSD. Aluminium.Average lead time: 42 daysPOA
Average lead time: 42 days
SEM Specimen Stubs, 10mm dia, angled, carbon AGG3424SEM Specimen Stubs for JEOL instruments. 10mm dia, angled. Carbon.Average lead time: 42 daysPOA
Average lead time: 42 days
SEM Specimen Stubs, 15mm dia, angled, carbon AGG3425SEM Specimen Stubs for ISI/ABT/TOPCON instruments. 15mm dia, angled. Carbon.Average lead time: 42 daysPOA
Average lead time: 42 days
