Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.
SEM Specimen Stubs, 50mm dia, 10mm high (Pk 20) AGG3387-20SEM Specimen Stubs for JEOL instruments. 50mm dia, 10mm high. Aluminium.In StockPOA
In Stock- SEM Specimen Stubs, 32mm dia, 20mm highSEM Specimen Stubs for JEOL instruments. 32mm dia, 20mm high. Aluminium. Special prices valid while stocks last.Average lead time: 19 to 58 days
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Average lead time: 19 to 58 days 
SEM Specimen Stubs, 12.5mm dia, 5mm high AGG3385SEM Specimen Stubs for JEOL instruments. 12.5mm diameter.In StockPOA
In Stock
SEM Specimen Stubs, 12.5mm dia, 10mm high AGG3384SEM Specimen Stubs for JEOL instruments. 12.5mm dia, 10mm high. Aluminium.In StockPOA
In Stock
SEM Specimen Stubs, 25mm dia, 16mm high, double angled 90° chamfer AGG3172SEM Specimen Stubs for JEOL instruments. 25mm dia, 16mm high, double angled 90° chamfer. Aluminium.In StockPOA
In Stock
SEM Specimen Stubs, 25mm dia, 16mm high, angled 45/90° chamfer AGG3171SEM Specimen Stubs for JEOL instruments. 25mm dia, 16mm high, angled 45/90° chamfer. Aluminium.In StockPOA
In Stock- SEM Specimen Stubs, 25mm dia, 20mm high, angled 45° chamfer AGG3170SEM Specimen Stubs for JEOL instruments. 25mm dia, 20mm high, angled 45° chamfer. Aluminium.In Stock
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In Stock 
SEM Specimen Stubs, 50mm dia, 5mm highSEM Specimen Stubs for JEOL instruments. 50mm dia, pin length 5mm. Aluminium.Average lead time: 43 daysPOA
Average lead time: 43 days
SEM Specimen Stubs, 25mm dia, 10mm high, cylinder stubSEM Specimen Stubs for JEOL instruments. 25mm dia, pin length 10mm, cylinder stubs. Aluminium.Average lead time: 1 dayPOA
Average lead time: 1 day
SEM Specimen Stubs, 12.7mm dia, low profile 70° chamfer, 9.5mm pin.... AGG3163SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.7mm dia, low profile 70° chamfer, pin length 8mm. EBSD. Aluminium.Average lead time: 43 daysPOA
Average lead time: 43 days
SEM Specimen Stubs, 12.5mm dia, carbon AGG321SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 12.5mm dia. CarbonIn StockPOA
In Stock
SEM Specimen Stubs, 9.5mm dia, 9.5mm high, carbonSEM Specimen Stubs for JEOL instruments. 9.5mm dia, 9.5mm high. Carbon.Average lead time: 1 to 19 daysPOA
Average lead time: 1 to 19 days
SEM Specimen Stubs, 10mm dia, angled, carbon AGG3424SEM Specimen Stubs for JEOL instruments. 10mm dia, angled. Carbon.Average lead time: 43 daysPOA
Average lead time: 43 days- SEM Specimen Stubs, 12.5mm dia, 10mm high, carbon AGG3427SEM Specimen Stubs for JEOL instruments. 12.5mm dia, 10mm high. Carbon. Special prices valid while stocks last.In Stock
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In Stock 
45˚ SEM Mount 12.7mm Aluminum, grooved edge AG1610145˚ SEM Mount Ø12.7mm for FEI, Tescan, Zeiss (also for Philips, Leo, Cambridge, AMRAY, Leica, CamScan, ETEC) SEM's.Average lead time: 19 daysPOA
Average lead time: 19 days
JEOL 6400/5800 Stage Adapter for Pin Mounts AG15396-10Aluminium dovetail stage adapter for using standard 3.2mm (1/8") pin mounts with the JEOL SEM's.Average lead time: 19 daysPOA
Average lead time: 19 days
SEM Pin Stub 25.4mm diameter, Pk10 AG16144SEM Pin Stub 25.4mm diameter with 9.5mm pin height.In StockPOA
In Stock
SEM Pin Stub 32mm diameter, pack of 10 AG16148SEM Pin Stub 32mm diameter with 9.5mm pin height. Pack of 10.Average lead time: 19 daysPOA
Average lead time: 19 days
Thin Specimen Split Mount Holder, M4 AG15335-4Simple but effective design to hold wafers and thin samples up to 3.2mm (1/8").Average lead time: 8 daysPOA
Average lead time: 8 days
SEM pin mounts with engraved & numbered divisionsSEM pin mounts with engraved & numbered divisions for FEI/Philips, ZEISS/LEO, Cambridge, Leica, Amray, Tescan & Camscan SEMs.Average lead time: 19 to 28 daysPOA
Average lead time: 19 to 28 days
SEM Cylinder Specimen MountsLarge Specimen and Metallurgical Mounts for JEOL microscopes.Average lead time: 19 to 28 daysPOA
Average lead time: 19 to 28 days
