Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.
Thin section single holder M4 thread - Hitachi AG15431-4SEMClip Geological Thin Section Holders.In StockPOA
In Stock
Double Slotted Set Screw Vise, M4, Ø15 x 6mm AG16341Double slotted set screw vice with 2 ea. 1mm wide x 3mm deep slots to clamp thin specimens or cross sections.Average lead time: 11 daysPOA
Average lead time: 11 days
Metallographic Mount Holder, 40mm, M4 AG15405Specimen holder for 40mm metallographic mounts.In StockPOA
In Stock- Bulk Specimen Holder, M4 AG15308-4Bulk specimen holder holds irregular and round specimens up to a diameter of 32mm. Special prices valid while stocks last.In Stock
POA
In Stock 
Large Bulk Specimen Holder, M4 AG15321-4Opening is 32mm (1 1/4") wide x 32mm (1 1/4") long x 13mm (1/2") deep.Average lead time: 11 daysPOA
Average lead time: 11 days
Specimen Mount, M4, Ø50 x 6mm AG16328SEM Cylinder Specimen Mount for Hitachi SEM's with M4 thread. 50mm diameter.In StockPOA
In Stock
SEM cylinder mounts with engraved & numbered divisions for...SEM mounts for Hitachi SEMs with engraved and numbered divisions to accommodate multiple smaller samples.Average lead time: 18 daysPOA
Average lead time: 18 days
