Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.
- SEM Specimen Stubs, 15mm dia, 6mm high, M4 thread, carbon AGG3423SEM Specimen Stubs for HITACHI instruments. 15mm dia, 6mm high, M4 thread. Carbon. Special prices valid while stocks last.In Stock
POA
In Stock 
Multi Holder for 6 Pin Stubs, M4 AG15411Multi holder accommodates up to six standard 12.7mm pin stubs.Average lead time: 10 daysPOA
Average lead time: 10 days
Multi Holder for 12 Pin Stubs, M4 AG15417Multi holder accommodates up to 12 standard 12.7mm pin stubs.Average lead time: 10 daysPOA
Average lead time: 10 days
SEM Pin Stub 25.4mm diameter, Pk10 AG16144SEM Pin Stub 25.4mm diameter with 9.5mm pin height.In StockPOA
In Stock
SEM Pin Stub 32mm diameter, pack of 10 AG16148SEM Pin Stub 32mm diameter with 9.5mm pin height. Pack of 10.In StockPOA
In Stock
