Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.
SEM Specimen Stubs, 25mm dia, 3.2 x 6mm pin AGG399FSEM Specimen Stubs for LEO/ZEISS instruments. 25mm dia, pin length 6mm. Aluminium. Pack of 50.In StockPOA
In Stock
SEM Specimen Stubs, 25mm dia, double 90° chamfer, 9.5mm pin AGG3165SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments.In StockPOA
In Stock
SEM Specimen Stubs, 25mm dia, 45/90° chamfer, 9.5mm pin AGG3164SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments.In StockPOA
In Stock
SEM Specimen Stubs, 25mm dia, threaded pin AGG3025SEM Specimen Stubs for HITACHI instruments. 25mm dia, threaded pin. Aluminium.In StockPOA
In Stock
SEM Specimen Stubs, 25mm dia, 6mm high, M4 thread AGG3377SEM Specimen Stubs for HITACHI instruments. 25mm dia, 6mm high, M4 thread. Aluminium.In StockPOA
In Stock
SEM Specimen Stubs, 25mm dia, 16mm high, double angled 90° chamfer AGG3172SEM Specimen Stubs for JEOL instruments. 25mm dia, 16mm high, double angled 90° chamfer. Aluminium.In StockPOA
In Stock
SEM Specimen Stubs, 25mm dia, 16mm high, angled 45/90° chamfer AGG3171SEM Specimen Stubs for JEOL instruments. 25mm dia, 16mm high, angled 45/90° chamfer. Aluminium.In StockPOA
In Stock- SEM Specimen Stubs, 25mm dia, 20mm high, angled 45° chamfer AGG3170SEM Specimen Stubs for JEOL instruments. 25mm dia, 20mm high, angled 45° chamfer. Aluminium.In Stock
POA
In Stock 
SEMClip Specimen Mounts, Cylinder mounts with M4 Thread, 25mmCylinder mount SEMClips for Hitachi SEMs, with M4 thread.Average lead time: 1 to 13 daysPOA
Average lead time: 1 to 13 days
SEMClip Specimen Mounts, Cylinder mounts with for JEOL SEMs, 25mm,...Cylinder mount SEMClips for JEOL SEMs.Average lead time: 13 daysPOA
Average lead time: 13 days
SEMClip Specimen Mounts, Pin Stub mounts, 25mm25mm diameter SEMClip mounts, available with 1, 2 or 3 clips.Average lead time: 1 dayPOA
Average lead time: 1 day
SEMClip Specimen Mounts, Cylinder mounts with for JEOL SEMs, 25mmCylinder mount SEMClips for JEOL SEMs.Average lead time: 13 to 20 daysPOA
Average lead time: 13 to 20 days
SEM Pin Stub 25.4mm diameter, Pk10 AG16144SEM Pin Stub 25.4mm diameter with 9.5mm pin height.In StockPOA
In Stock
SEM Specimen Stubs, 25.4mm square. Gun residue holders AGG3595SEM Specimen Stubs for forensic science. 25.4mm square (1"). Aluminium.Average lead time: 59 daysPOA
Average lead time: 59 days
Specimen Mount, 25mm dia x 10mm (Pk10) AG16153Aluminium, specimen mount, 25mm dia x 10mm, for AMRAY - special slotted head.Average lead time: 13 daysPOA
Average lead time: 13 days
SEM cylinder mounts with engraved & numbered divisions for JEOL...SEM mounts for JEOL SEMs with engraved and numbered divisions to accommodate multiple smaller samples.Average lead time: 20 daysPOA
Average lead time: 20 days
SEM cylinder mounts with engraved & numbered divisions for...SEM mounts for Hitachi SEMs with engraved and numbered divisions to accommodate multiple smaller samples.Average lead time: 20 daysPOA
Average lead time: 20 days
SEM pin mounts with engraved & numbered divisionsSEM pin mounts with engraved & numbered divisions for FEI/Philips, ZEISS/LEO, Cambridge, Leica, Amray, Tescan & Camscan SEMs.Average lead time: 20 to 29 daysPOA
Average lead time: 20 to 29 days
Hitachi SEM Cylinder Specimen MountsCylinder specimen mount for Hitachi TM3030/TM3000/TM1000 Tabletop SEM's. 15mm, 25mm and 35mm diameter.Average lead time: 1 to 29 daysPOA
Average lead time: 1 to 29 days
