Agar Scientific supply and stock a comprehensive range of SEM specimen stubs for a wide range of instruments including: Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss. In addition to standard pin stubs other shapes include: angled stubs, cylinder stubs, low profile pin stubs and M4 threaded stubs. The majority of stubs are machined from free cutting aluminium with some also available in high purity aluminium, brass, carbon or copper.
SEM Specimen Stubs, 32mm dia, re-entrant base AGG305SEM Specimen Stubs for CAMBRIDGE ANALYSIS instruments. 32mm dia, re-entrant base. Aluminium.In StockPOA
In Stock
SEM Specimen Stubs, 32mm dia, 5mm high AGG3376SEM Specimen Stubs for JEOL instruments. 32mm dia, 5mm high. Aluminium.In StockPOA
In Stock- SEM Specimen Stubs, 32mm dia, 20mm highSEM Specimen Stubs for JEOL instruments. 32mm dia, 20mm high. Aluminium. Special prices valid while stocks last.Average lead time: 20 to 59 days
POA
Average lead time: 20 to 59 days - SEM Specimen Stubs, 32mm dia, re-entrant base, carbon AGG327SEM Specimen Stubs for CAMBRIDGE ANALYSIS instruments. 32mm dia, re-entrant base. Carbon. Special prices valid while stocks last.In Stock
POA
In Stock 
SEM Cylinder Specimen MountsLarge Specimen and Metallurgical Mounts for JEOL microscopes.Average lead time: 20 to 29 daysPOA
Average lead time: 20 to 29 days
